<\/p>\n

Birincisi, par\u00e7ac\u0131k boyutu analizi (1) par\u00e7ac\u0131klar\u0131n\u0131n temel konsepti: belirli boyut ve \u015fekillerde k\u00fc\u00e7\u00fck nesnelerle, toz bile\u015fiminin temel birimidir. \u00c7ok k\u00fc\u00e7\u00fckt\u00fcr, ancak mikroskopiktir, ancak \u00e7ok say\u0131da molek\u00fcl ve atom i\u00e7erir; (2) par\u00e7ac\u0131k boyutu: par\u00e7ac\u0131klar\u0131n boyutu; (3) par\u00e7ac\u0131k boyutu da\u011f\u0131l\u0131m\u0131: s\u0131ras\u0131yla bir dizi farkl\u0131 par\u00e7ac\u0131k boyutu par\u00e7ac\u0131\u011f\u0131n\u0131 yans\u0131tman\u0131n belirli bir yolu, toplam tozun y\u00fczdesi; (4) par\u00e7ac\u0131k boyutu da\u011f\u0131l\u0131m\u0131n\u0131n g\u00f6sterimi: tablo y\u00f6ntemi (aral\u0131k da\u011f\u0131l\u0131m\u0131 ve k\u00fcm\u00fclatif da\u011f\u0131l\u0131m), grafik y\u00f6ntem, i\u015flev y\u00f6ntemi, ortak RR da\u011f\u0131l\u0131m\u0131, normal da\u011f\u0131l\u0131m; (5) par\u00e7ac\u0131k boyutu: par\u00e7ac\u0131klar\u0131n \u00e7ap\u0131 genellikle bir birim olarak mikron cinsinden; (6) E\u015fde\u011fer par\u00e7ac\u0131k boyutu: Fiziksel \u00f6zelliklere sahip bir par\u00e7ac\u0131k ve homojen k\u00fcresel par\u00e7ac\u0131klar ayn\u0131 veya benzer oldu\u011funda, ger\u00e7ek par\u00e7ac\u0131klar\u0131n \u00e7ap\u0131n\u0131 temsil etmek i\u00e7in d\u00fcz \u00c7apl\u0131 k\u00fcresel par\u00e7ac\u0131klar\u0131 kullan\u0131r\u0131z; (7) D10 , kar\u015f\u0131l\u0131k gelen par\u00e7ac\u0131k b\u00fcy\u00fckl\u00fc\u011f\u00fcn\u00fcn 10%'nin k\u00fcm\u00fclatif da\u011f\u0131l\u0131m\u0131; D50'de, y\u00fczdenin k\u00fcm\u00fclatif da\u011f\u0131l\u0131m\u0131, kar\u015f\u0131l\u0131k gelen par\u00e7ac\u0131k boyutunun 50%'sine ula\u015ft\u0131; medyan veya medyan partik\u00fcl b\u00fcy\u00fckl\u00fc\u011f\u00fc olarak da bilinir; D90'da, y\u00fczdenin k\u00fcm\u00fclatif da\u011f\u0131l\u0131m\u0131, kar\u015f\u0131l\u0131k gelen par\u00e7ac\u0131k boyutunun 90%'sine ula\u015ft\u0131; D (4,3) hacim veya k\u00fctle ortalama partik\u00fcl b\u00fcy\u00fckl\u00fc\u011f\u00fc; \u0130kincisi, yayg\u0131n olarak kullan\u0131lan partik\u00fcl b\u00fcy\u00fckl\u00fc\u011f\u00fc \u00f6l\u00e7\u00fcm y\u00f6ntemi (1) eleme y\u00f6ntemi (2) sedimantasyon y\u00f6ntemi (yer\u00e7ekimi sedimantasyon y\u00f6ntemi, santrif\u00fcj sedimantasyon y\u00f6ntemi) (3) diren\u00e7 y\u00f6ntemi (Kurt partik\u00fcl sayac\u0131 ) (4) Mikroskop (g\u00f6r\u00fcnt\u00fc) y\u00f6ntemi (5) Elektron mikroskopisi (6) ultrasonik y\u00f6ntem (7) nefes alabilen y\u00f6ntem (8) lazer k\u0131r\u0131n\u0131m y\u00f6ntemi \u00c7e\u015fitli y\u00f6ntemlerin avantajlar\u0131 ve dezavantajlar\u0131 Elek y\u00f6ntemi: Avantajlar: basit, sezgisel, d\u00fc\u015f\u00fck ekipman maliyeti, yayg\u0131n olarak kullan\u0131lan 40\u03bcm'den b\u00fcy\u00fck numunelerde. Dezavantajlar\u0131: 40\u03bcm ince \u00f6rnek i\u00e7in kullan\u0131lamaz; fakt\u00f6rler ve daha b\u00fcy\u00fck bir etkinin elek deformasyonu ile sonu\u00e7lar.Mikroskop: Avantajlar\u0131: basit, sezgisel, morfolojik analiz olabilir. Dezavantajlar\u0131: yava\u015f, zay\u0131f temsilci, ultra ince par\u00e7ac\u0131klar\u0131 \u00f6l\u00e7emez.Tort\u00fcsyon y\u00f6ntemi (yer\u00e7ekimi yerle\u015fimi ve santrif\u00fcj yerle\u015fimi dahil): Avantajlar\u0131: kullan\u0131m\u0131 kolay, cihaz s\u00fcrekli \u00e7al\u0131\u015fabilir, d\u00fc\u015f\u00fck fiyat, do\u011fruluk ve tekrarlanabilirlik daha iyidir, test aral\u0131\u011f\u0131 daha b\u00fcy\u00fck. Dezavantajlar\u0131: test s\u00fcresi uzundur. Diren\u00e7 y\u00f6ntemi: Avantajlar\u0131: kullan\u0131m\u0131 kolay, toplam par\u00e7ac\u0131k say\u0131s\u0131 \u00f6l\u00e7\u00fclebilir, e\u015fde\u011fer kavram a\u00e7\u0131k, h\u0131zl\u0131, iyi do\u011fruluk. Dezavantajlar\u0131: test aral\u0131\u011f\u0131 k\u00fc\u00e7\u00fckt\u00fcr, par\u00e7ac\u0131klar taraf\u0131ndan engellenmesi kolayd\u0131r, ortam\u0131n s\u0131k\u0131 elektriksel \u00f6zelliklere sahip olmas\u0131 gerekir.Elektron mikroskopisi: Avantajlar: ultra ince par\u00e7ac\u0131klar\u0131 veya hatta nano par\u00e7ac\u0131klar\u0131 test etmek i\u00e7in uygundur, y\u00fcksek \u00e7\u00f6z\u00fcn\u00fcrl\u00fck. Dezavantajlar\u0131: daha az \u00f6rnek, k\u00f6t\u00fc temsil, enstr\u00fcman pahal\u0131d\u0131r Ultrasonik y\u00f6ntem: Avantajlar: y\u00fcksek ka\u011f\u0131t hamuru konsantrasyonlar\u0131n\u0131n do\u011frudan \u00f6l\u00e7\u00fcm\u00fc. Dezavantajlar\u0131: d\u00fc\u015f\u00fck \u00e7\u00f6z\u00fcn\u00fcrl\u00fck Havaland\u0131rma y\u00f6ntemi: Avantajlar\u0131: cihaz fiyatlar\u0131 d\u00fc\u015f\u00fckt\u00fcr, numuneyi da\u011f\u0131tmak zorunda de\u011fildir, manyetik par\u00e7ac\u0131klar toz \u00f6l\u00e7\u00fclebilir. Dezavantajlar\u0131: sadece ortalama par\u00e7ac\u0131k boyutunu alabilir, par\u00e7ac\u0131k boyutu da\u011f\u0131l\u0131m\u0131n\u0131 \u00f6l\u00e7emez.Lazer y\u00f6ntemi: Avantajlar\u0131: kullan\u0131m\u0131 kolay, h\u0131zl\u0131 test, test aral\u0131\u011f\u0131, tekrarlanabilirlik ve do\u011fruluk ve \u00e7evrimi\u00e7i ve kuru olarak \u00f6l\u00e7\u00fclebilir. Dezavantajlar\u0131: da\u011f\u0131t\u0131m modelinden etkilenen sonu\u00e7lar, cihaz\u0131n maliyeti daha y\u00fcksektir.\u00dc\u00e7\u00fcnc\u00fc, lazer partik\u00fcl boyutu analiz\u00f6r\u00fcn\u00fcn temel prensibi K\u00fc\u00e7\u00fck a\u00e7\u0131 sa\u00e7\u0131l\u0131m\u0131nda lazer k\u0131r\u0131n\u0131m\u0131 teknolojisi ba\u015flad\u0131, bu nedenle bu teknoloji de \u015fu ada sahiptir: Fraunhofer k\u0131r\u0131n\u0131m y\u00f6ntemi ( Yakla\u015f\u0131k) pozitif \u0131\u015f\u0131k sa\u00e7\u0131lma y\u00f6ntemi K\u00fc\u00e7\u00fck a\u00e7\u0131l\u0131 lazer sa\u00e7\u0131lma y\u00f6ntemi (LALLS) \u015eu anda, bu teknoloji yelpazesi Fraunhofer k\u0131r\u0131n\u0131m\u0131 ve d\u00fczensiz k\u0131r\u0131n\u0131m gibi yakla\u015f\u0131k teoriye ek olarak daha geni\u015f bir a\u00e7\u0131 aral\u0131\u011f\u0131nda \u0131\u015f\u0131k sa\u00e7\u0131l\u0131m\u0131n\u0131 i\u00e7erecek \u015fekilde geni\u015fletilmi\u015ftir. Mie teorisi art\u0131k enstr\u00fcman \u00fcreticileri Teorisi taraf\u0131ndan \u00fcr\u00fcnlerinin \u00f6nemli avantajlar\u0131ndan biri olarak kullan\u0131lmaktad\u0131r. Mickey teorisine bir Alman bilim adam\u0131n\u0131n ad\u0131 verilmi\u015ftir. D\u00fczg\u00fcn, emici olmayan ortamdaki tekd\u00fcze k\u00fcresel par\u00e7ac\u0131klar\u0131 ve radyasyon uzay\u0131ndaki \u00e7evresini a\u00e7\u0131klar, par\u00e7ac\u0131klar tamamen \u015feffaf olabilir veya tamamen emilebilir. Milleri teorisi, \u0131\u015f\u0131k sa\u00e7\u0131l\u0131m\u0131n\u0131n bir rezonans fenomeni oldu\u011funu a\u00e7\u0131klar. I\u015f\u0131n\u0131n belirli bir dalga boyu bir par\u00e7ac\u0131\u011fa rastlarsa, par\u00e7ac\u0131k yay\u0131lan \u0131\u015f\u0131k kayna\u011f\u0131 ile ayn\u0131 frekansta - \u0131\u015f\u0131\u011f\u0131n dalga boyu, par\u00e7ac\u0131k \u00e7ap\u0131 ve par\u00e7ac\u0131klar\u0131n ve ortam\u0131n k\u0131r\u0131lma indisine bak\u0131lmaks\u0131z\u0131n bir elektromanyetik titre\u015fim \u00fcretir. Par\u00e7ac\u0131klar belirli bir dalga boyunda ayarlan\u0131r ve al\u0131n\u0131r ve enerji belirli bir uzamsal a\u00e7\u0131sal da\u011f\u0131l\u0131m\u0131n yan\u0131 s\u0131ra bir r\u00f6le i\u00e7inde yeniden yay\u0131l\u0131r. Mie teorisine g\u00f6re, \u00e7e\u015fitli olas\u0131l\u0131klar\u0131n \u00e7oklu sal\u0131n\u0131mlar\u0131n\u0131 \u00fcretmek m\u00fcmk\u00fcnd\u00fcr ve optik eylemin kesiti ile par\u00e7ac\u0131k boyutu, \u0131\u015f\u0131\u011f\u0131n dalga boyu ve par\u00e7ac\u0131klar\u0131n ve ortam\u0131n k\u0131r\u0131lma indisi aras\u0131nda belirli bir ili\u015fki vard\u0131r. . Mie teorisini kullan\u0131rsan\u0131z, numunenin ve ortam\u0131n k\u0131r\u0131lma indisi ve emilim katsay\u0131s\u0131n\u0131 bilmeniz gerekir.Fraunhofer teorisi, tah\u0131l\u0131n kenar\u0131ndaki sa\u00e7\u0131lmaya dayanan bir Alman fizik\u00e7i Franco ve Fader'den sonra adland\u0131r\u0131l\u0131r ve sadece tamamen opak partik\u00fcllere ve k\u00fc\u00e7\u00fck sa\u00e7\u0131lma a\u00e7\u0131lar\u0131na uygulanmal\u0131d\u0131r. Par\u00e7ac\u0131k boyutu dalga boyundan k\u00fc\u00e7\u00fck veya ona e\u015fit oldu\u011funda, Fraunhofer nesli t\u00fckenme katsay\u0131s\u0131n\u0131n sabit oldu\u011fu varsay\u0131m\u0131 art\u0131k uygulanamaz (Mie teorisinin bir yakla\u015f\u0131m\u0131, yani Mi'nin hayali alt k\u00fcmeler teorisini g\u00f6rmezden gelmek ve \u0131\u015f\u0131\u011f\u0131 g\u00f6rmezden gelmek) sa\u00e7\u0131lma katsay\u0131s\u0131 ve Absorpsiyon katsay\u0131s\u0131, yani t\u00fcm da\u011f\u0131t\u0131c\u0131 ve da\u011f\u0131t\u0131c\u0131 optik parametreler 1 olarak ayarlan\u0131r, matematiksel i\u015flem \u00e7ok daha basittir, malzemenin rengi ve k\u00fc\u00e7\u00fck par\u00e7ac\u0131klar da \u00e7ok daha b\u00fcy\u00fck bir hatad\u0131r. Lazer par\u00e7ac\u0131k boyutu analiz\u00f6r\u00fc, k\u0131r\u0131n\u0131m olgusu oldu\u011funda par\u00e7ac\u0131klardan ge\u00e7en \u0131\u015f\u0131k (\u00f6z\u00fc elektromanyetik dalgalar ve maddelerin etkile\u015fimi) oldu\u011funda, \u0131\u015f\u0131k k\u0131r\u0131n\u0131m\u0131 fenomenine dayanmaktad\u0131r. K\u0131r\u0131nan \u0131\u015f\u0131\u011f\u0131n a\u00e7\u0131s\u0131 par\u00e7ac\u0131\u011f\u0131n b\u00fcy\u00fckl\u00fc\u011f\u00fc ile ters orant\u0131l\u0131d\u0131r. K\u0131r\u0131n\u0131m \u0131\u015f\u0131\u011f\u0131 farkl\u0131 pozisyonlara d\u00fc\u015ft\u00fc\u011f\u00fcnde lazer \u0131\u015f\u0131n\u0131 boyunca farkl\u0131 par\u00e7ac\u0131k boyutlar\u0131, konum bilgisi par\u00e7ac\u0131k boyutunu yans\u0131t\u0131r; k\u0131r\u0131n\u0131m \u0131\u015f\u0131\u011f\u0131 ayn\u0131 pozisyona d\u00fc\u015ft\u00fc\u011f\u00fcnde lazer \u0131\u015f\u0131n\u0131 boyunca ayn\u0131 b\u00fcy\u00fck par\u00e7ac\u0131klar. K\u0131r\u0131nan \u0131\u015f\u0131k yo\u011funlu\u011funun bilgisi, numunede ayn\u0131 boyuttaki par\u00e7ac\u0131klar\u0131n y\u00fczdesini yans\u0131t\u0131r.Lazer k\u0131r\u0131n\u0131m y\u00f6ntemi, k\u0131r\u0131nan \u0131\u015f\u0131\u011f\u0131n yo\u011funlu\u011funu par\u00e7ac\u0131\u011f\u0131n par\u00e7ac\u0131k boyutunun farkl\u0131 a\u00e7\u0131lar\u0131nda \u00f6l\u00e7mek i\u00e7in bir dizi fotodetekt\u00f6r kullan\u0131r. k\u0131r\u0131lma modeli, matematiksel ters \u00e7evirme ve daha sonra numunenin par\u00e7ac\u0131k boyutu da\u011f\u0131l\u0131m\u0131.Ve konum detekt\u00f6r\u00fc taraf\u0131ndan al\u0131nan da\u011f\u0131n\u0131k \u0131\u015f\u0131k yo\u011funlu\u011fu, kar\u015f\u0131l\u0131k gelen par\u00e7ac\u0131k boyutunun y\u00fczde i\u00e7eri\u011fini verir. Da\u011f\u0131n\u0131k \u0131\u015f\u0131\u011f\u0131n yo\u011funlu\u011funun par\u00e7ac\u0131klara ba\u011f\u0131ml\u0131l\u0131\u011f\u0131 partik\u00fcl b\u00fcy\u00fckl\u00fc\u011f\u00fcn\u00fcn azalmas\u0131 ile azal\u0131r. Par\u00e7ac\u0131klar birka\u00e7 y\u00fcz nanometre kadar k\u00fc\u00e7\u00fck oldu\u011funda, k\u0131r\u0131n\u0131m yo\u011funlu\u011fu neredeyse tamamen a\u00e7\u0131ya ba\u011fl\u0131d\u0131r, yani \u015fu anda k\u0131r\u0131nan \u0131\u015f\u0131k Geni\u015f bir a\u00e7\u0131 aral\u0131\u011f\u0131nda da\u011f\u0131lm\u0131\u015ft\u0131r ve birim alan ba\u015f\u0131na \u0131\u015f\u0131k yo\u011funlu\u011fu \u00e7ok zay\u0131ft\u0131r, 1um ve geni\u015f partik\u00fcl boyut aral\u0131klar\u0131 (onlarca nanometreden birka\u00e7 bin mikrometreye) alt\u0131ndaki numunelerin \u00f6l\u00e7\u00fcm\u00fc, lazer k\u0131r\u0131n\u0131m gran\u00fclat\u00f6r\u00fcn\u00fcn anahtar\u0131d\u0131r. Genel olarak, a\u015fa\u011f\u0131daki teknikler ve optik yol yap\u0131land\u0131rmalar\u0131 kullan\u0131l\u0131r: 1, \u00e7oklu lens teknolojisi \u00c7oklu lens sistemi, \u00f6rnek h\u00fccrenin odaklama merce\u011finin \u00f6n\u00fcne yerle\u015ftirildi\u011fi bir Fourier optik yol yap\u0131land\u0131rmas\u0131 kullan\u0131larak 1980'lerden \u00f6nce yayg\u0131n olarak benimsenmi\u015ftir. farkl\u0131 partik\u00fcl boyutu aral\u0131klar\u0131na uyum sa\u011flamak i\u00e7in lensin bir dizi farkl\u0131 odak uzakl\u0131\u011f\u0131 ile donat\u0131lm\u0131\u015ft\u0131r. Avantaj\u0131 basit tasar\u0131md\u0131r, sadece odak d\u00fczlemi dedekt\u00f6r\u00fcn\u00fcn onlarca derece aral\u0131\u011f\u0131nda da\u011f\u0131t\u0131lmas\u0131 gerekir, maliyet d\u00fc\u015f\u00fckt\u00fcr. Dezavantaj\u0131, merce\u011fin de\u011fi\u015ftirilmesi gerekti\u011finde \u00f6rnek boyutu geni\u015fse, farkl\u0131 merceklerin sonu\u00e7lar\u0131n\u0131n b\u00f6l\u00fcnmesi gerekti\u011fidir, \u00e7\u00fcnk\u00fc mercek \u00f6l\u00e7\u00fcm\u00fc olan \u00f6rne\u011fin bilinmeyen baz\u0131 par\u00e7ac\u0131k boyutu sinyali kaybedebilir veya neden olunan i\u015flem de\u011fi\u015fiklikleri nedeniyle \u00d6rneklemdeki de\u011fi\u015fikliklerle zaman\u0131nda yans\u0131t\u0131lamaz.2, \u00e7oklu \u0131\u015f\u0131k teknolojisi\u00c7oklu \u0131\u015f\u0131k kayna\u011f\u0131 teknolojisi, genellikle sadece onlarca aral\u0131kta da\u011f\u0131t\u0131lan odaklama merce\u011finin \u00f6n\u00fcndeki \u00f6rnek h\u00fccrenin Fourier optik yol yap\u0131land\u0131rmas\u0131nda da kullan\u0131l\u0131r. derece dedekt\u00f6r\u00fc, g\u00f6receli alg\u0131lama a\u00e7\u0131s\u0131n\u0131 artt\u0131rmak i\u00e7in, dedekt\u00f6r optik sinyali da\u011f\u0131tan ve ilk veya ikinci lazeri ilk \u0131\u015f\u0131k kayna\u011f\u0131n\u0131n optik eksenine g\u00f6re farkl\u0131 a\u00e7\u0131larda atayan k\u00fc\u00e7\u00fck par\u00e7ac\u0131klar alabilir. Bu tekni\u011fin avantaj\u0131, sadece onlarca derece da\u011f\u0131t\u0131lan bir dedekt\u00f6r olmas\u0131 ve maliyetin d\u00fc\u015f\u00fck olmas\u0131d\u0131r. \u00d6l\u00e7\u00fcm aral\u0131\u011f\u0131, \u00f6zellikle \u00fcst limit geni\u015f olabilir. Dezavantaj\u0131, k\u00fc\u00e7\u00fck a\u00e7\u0131 aral\u0131\u011f\u0131nda da\u011f\u0131t\u0131lan k\u00fc\u00e7\u00fck alan detekt\u00f6r\u00fcn\u00fcn k\u00fc\u00e7\u00fck par\u00e7ac\u0131k \u00f6l\u00e7\u00fcm\u00fc i\u00e7in de kullan\u0131lmas\u0131d\u0131r, \u00e7\u00fcnk\u00fc sinyalin birim alan\u0131ndaki k\u0131r\u0131nan \u0131\u015f\u0131\u011f\u0131n k\u00fc\u00e7\u00fck par\u00e7ac\u0131klar\u0131n\u0131n zay\u0131f olmas\u0131, sinyal-g\u00fcr\u00fclt\u00fc oran\u0131 oldu\u011funda k\u00fc\u00e7\u00fck par\u00e7ac\u0131klara neden olur. azalt\u0131l\u0131r, bu y\u00fczden birka\u00e7 mikron olmas\u0131n\u0131 sa\u011flamak i\u00e7in 1500 mikron ya da daha fazla \u00f6l\u00e7\u00fcm aral\u0131\u011f\u0131nda \u00e7oklu \u0131\u015f\u0131k kayna\u011f\u0131 sistemi Do\u011fru \u00f6l\u00e7\u00fcm\u00fcn a\u015fa\u011f\u0131daki k\u00fc\u00e7\u00fck par\u00e7ac\u0131klar\u0131, odak merce\u011finin k\u0131sa odak uzunlu\u011funu de\u011fi\u015ftirme ihtiyac\u0131 . Ek olarak, numunelerin \u00f6l\u00e7\u00fcm\u00fcnde \u00e7oklu lens sistemi, farkl\u0131 lazerler a\u00e7\u0131l\u0131r ve kuru \u00f6l\u00e7\u00fcmde, \u00e7\u00fcnk\u00fc par\u00e7ac\u0131klar sadece \u00f6rnek havuzundan ge\u00e7ebilir, \u00f6l\u00e7\u00fcm i\u00e7in sadece bir \u0131\u015f\u0131k kayna\u011f\u0131 kullan\u0131labilir, bu nedenle \u00e7oklu lens teknolojisinin genel kullan\u0131m\u0131 Kuru boyutun alt limiti 250 nm'den azd\u0131r.3, \u00e7ok y\u00f6ntemli hibrit sistem\u00c7ok y\u00f6ntemli hibrit sistem, lazer k\u0131r\u0131n\u0131m y\u00f6ntemini ve par\u00e7ac\u0131k boyutu analiz\u00f6r\u00fcn\u00fcn, lazer tasar\u0131m\u0131n\u0131n di\u011fer kar\u0131\u015ft\u0131rma y\u00f6ntemlerini ifade eder. Da\u011f\u0131l\u0131m\u0131n k\u0131r\u0131n\u0131m k\u0131sm\u0131, dedekt\u00f6r\u00fcn sadece birka\u00e7 on derece aral\u0131\u011f\u0131 ve daha sonra PCS, genellikle birka\u00e7 mikron gibi di\u011fer y\u00f6ntemlerle desteklenir. Yukar\u0131daki lazer k\u0131r\u0131n\u0131m\u0131 ile \u00f6l\u00e7\u00fcl\u00fcr ve birka\u00e7 mikronun alt\u0131ndaki par\u00e7ac\u0131klar di\u011fer y\u00f6ntemlerle \u00f6l\u00e7\u00fcl\u00fcr. Teorik olarak, par\u00e7ac\u0131k boyutunun alt limiti yard\u0131mc\u0131 y\u00f6ntemin alt limitine ba\u011fl\u0131d\u0131r. Bu y\u00f6ntemin avantaj\u0131, maliyetin d\u00fc\u015f\u00fck olmas\u0131 ve toplam \u00f6l\u00e7\u00fcm aral\u0131\u011f\u0131n\u0131n geni\u015f olmas\u0131, y\u00f6ntemin gerektirdi\u011fi en iyi \u00f6l\u00e7\u00fcm ko\u015fullar\u0131n\u0131n, \u00f6rne\u011fin konsantrasyonu ayn\u0131 olmamas\u0131, genellikle dengelenmesinin zor olmas\u0131 ve farkl\u0131 y\u00f6ntemler aras\u0131ndaki sistematik hata, \u00f6rne\u011fin par\u00e7ac\u0131k boyutunun sadece k\u0131r\u0131n\u0131m y\u00f6ntemi aral\u0131\u011f\u0131 veya aral\u0131\u011f\u0131 i\u00e7inde oldu\u011fu bilinmedi\u011fi s\u00fcrece, iki y\u00f6ntemin veri montaj alan\u0131nda istenen sonucu elde etmek genellikle zordur. yard\u0131mc\u0131 y\u00f6ntem. Ek olarak, \u00e7ok y\u00f6ntemli kar\u0131\u015ft\u0131rma sistemi, iki farkl\u0131 numune h\u00fccresi gerektirir, bu da \u0131slak \u00f6l\u00e7\u00fcm i\u00e7in bir sorun de\u011fildir, \u00e7\u00fcnk\u00fc numune geri d\u00f6n\u00fc\u015ft\u00fcr\u00fclebilir, ancak numune sadece kuru bir i\u015flem i\u00e7in numune h\u00fccresi i\u00e7inde sirk\u00fcle edilebilir, E\u015fzamanl\u0131 \u00f6l\u00e7\u00fcm y\u00f6ntemi , bu nedenle par\u00e7ac\u0131k boyutunun alt s\u0131n\u0131r\u0131n\u0131n kuru \u00f6l\u00e7\u00fcm\u00fcnde \u00e7e\u015fitli y\u00f6ntemler kar\u0131\u015f\u0131k sistem sadece y\u00fczlerce nanometre olabilir.4, geni\u015f a\u00e7\u0131 alg\u0131lama teknolojisi ve anti-Fourier optik sistem i\u00e7in e\u015fit olmayan \u00e7apraz geni\u015f telafi \u00fcniform olmayan \u00e7apraz geni\u015f alan kompanzasyonu ve anti-Fourier optik sistemin a\u00e7\u0131 tespiti 1990'lar\u0131n sonunda geli\u015ftirilmi\u015ftir. Anti-Fourier optik yol konfig\u00fcrasyonu, h\u00fccreyi odaklama merce\u011finin arkas\u0131na yerle\u015ftirmek i\u00e7in kullan\u0131l\u0131r, \u00c7ok geni\u015f bir a\u00e7\u0131 aral\u0131\u011f\u0131nda, 150 dereceye kadar genel fiziksel alg\u0131lama a\u00e7\u0131s\u0131, b\u00f6ylece onlarca nanometreyi birka\u00e7 bine kadar \u00f6l\u00e7mek i\u00e7in tek bir lens mikron \u00f6rne\u011fi m\u00fcmk\u00fcn, dedekt\u00f6r tasar\u0131m\u0131nda g\u00f6sterilen optik \u015fematik diyagram Tekd\u00fcze olmayan \u00e7apraz kullan\u0131m\u0131 ve dedekt\u00f6r alan\u0131n\u0131n boyutundaki art\u0131\u015fla, her ikisi de b\u00fcy\u00fck par\u00e7ac\u0131klar\u0131n \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fcn\u00fc sa\u011flamak i\u00e7in d\u00fczenlemeyi artt\u0131rd\u0131. \u00f6l\u00e7\u00fcm ayr\u0131ca k\u00fc\u00e7\u00fck bir par\u00e7ac\u0131k alg\u0131lama sinyalinin g\u00fcr\u00fclt\u00fc oran\u0131na ve hassasiyetine de olanak tan\u0131r. Lensi de\u011fi\u015ftirmeye gerek yoktur ve di\u011fer y\u00f6ntemler onlarca nanometreden birka\u00e7 bin mikron par\u00e7ac\u0131\u011fa kadar \u00f6l\u00e7\u00fclebilir, hatta kuru \u00f6l\u00e7\u00fcm, alt s\u0131n\u0131r 0.1 mikrona ula\u015fabilir. Bu yakla\u015f\u0131m\u0131n dezavantaj\u0131, enstr\u00fcman\u0131n maliyetinin \u00f6nceki y\u00f6ntemlere g\u00f6re y\u00fcksek olmas\u0131d\u0131r.Lazerden yay\u0131lan lazer \u0131\u015f\u0131n\u0131, yakla\u015f\u0131k 10 mm \u00e7ap\u0131nda paralel bir \u0131\u015f\u0131na mikroskop, i\u011fne deli\u011fi filtresi ve kolimat\u00f6r kolimasyonu ile odaklan\u0131r, \u0131\u015f\u0131n \u00f6l\u00e7\u00fclecek par\u00e7ac\u0131klara \u0131\u015f\u0131nlan\u0131r, \u0131\u015f\u0131\u011f\u0131n bir k\u0131sm\u0131 sa\u00e7\u0131l\u0131r, Yaprak mercek, radyo ve televizyon detekt\u00f6r dizisine radyasyon. Radyo ve televizyon dedekt\u00f6r\u00fc Fourier merce\u011finin odak d\u00fczleminde oldu\u011fundan, dedekt\u00f6r \u00fczerindeki herhangi bir nokta belirli bir sa\u00e7\u0131lma a\u00e7\u0131s\u0131na kar\u015f\u0131l\u0131k gelir. Radyo ve televizyon dedekt\u00f6rleri dizisi, her biri yukar\u0131da yans\u0131t\u0131lan da\u011f\u0131n\u0131k \u0131\u015f\u0131\u011f\u0131 do\u011frusal olarak bir voltaja d\u00f6n\u00fc\u015ft\u00fcrebilen ve daha sonra elektrik sinyalini d\u00f6n\u00fc\u015ft\u00fcren bir veri toplama kart\u0131na g\u00f6nderebilen ayr\u0131 bir dedekt\u00f6r olan bir dizi e\u015f merkezli halkadan olu\u015fur. A \/ D anahtar\u0131n\u0131 bilgisayara getirdikten sonra yak\u0131nla\u015ft\u0131r\u0131n.\u015eimdi lazer par\u00e7ac\u0131k boyutu cihaz\u0131n\u0131n ger\u00e7ek yap\u0131s\u0131 b\u00fcy\u00fck bir de\u011fi\u015fiklik oynad\u0131, ancak ayn\u0131 prensip.\u015eu anda, insanlar a\u015fa\u011f\u0131daki sonu\u00e7lara vard\u0131: (1) daha az \u00f6l\u00e7\u00fcm 1 mm'den fazla par\u00e7ac\u0131k, Mie teorisini kullanmal\u0131s\u0131n\u0131z; (2) 1 mm'den fazla par\u00e7ac\u0131k \u00f6l\u00e7mek, e\u011fer aletin alt \u00f6l\u00e7\u00fcm s\u0131n\u0131r\u0131 3 mm'den azsa, cihaz hala Mie teorisini veya par\u00e7ac\u0131k boyutu da\u011f\u0131l\u0131m\u0131nda \u201cHi\u00e7bir \u015feyden yok\u201d zirvesinin yak\u0131n\u0131nda 1mm; (3) Lazer par\u00e7ac\u0131k boyutu analiz\u00f6r\u00fc ko\u015fullar\u0131n k\u0131r\u0131n\u0131m teorisini kullanabilir: cihaz\u0131n alt \u00f6l\u00e7\u00fcm s\u0131n\u0131r\u0131 3 mm'den fazla veya \u00f6l\u00e7\u00fclen par\u00e7ac\u0131k emici tiptir ve par\u00e7ac\u0131k boyutu 1 mm'den b\u00fcy\u00fckt\u00fcr; (4) Evrensel bir lazer par\u00e7ac\u0131k boyutu analiz\u00f6r\u00fc olarak, alt \u00f6l\u00e7\u00fcm s\u0131n\u0131r\u0131 1 mm'den az oldu\u011fu s\u00fcrece, b\u00fcy\u00fck par\u00e7ac\u0131klar\u0131 veya k\u00fc\u00e7\u00fck par\u00e7ac\u0131klar\u0131 \u00f6l\u00e7mek i\u00e7in kullan\u0131ls\u0131n, Be\u015finci olarak, lazer partik\u00fcl boyutu analiz\u00f6r\u00fcn\u00fcn bile\u015fimi Monokromatik, tutarl\u0131 ve paralel bir \u0131\u015f\u0131n \u00fcretmek i\u00e7in bir \u0131\u015f\u0131k kayna\u011f\u0131 (genellikle bir lazer) kullan\u0131l\u0131r; \u0131\u015f\u0131n i\u015fleme \u00fcnitesi, da\u011f\u0131lm\u0131\u015f par\u00e7ac\u0131klar\u0131 ayd\u0131nlatmak i\u00e7in geni\u015fletilmi\u015f, idealine yak\u0131n \u0131\u015f\u0131k \u0131\u015f\u0131nlar\u0131 demeti \u00fcreten bir entegre filtreye sahip bir \u0131\u015f\u0131n amplifikat\u00f6r\u00fcd\u00fcr (sabit dalga boylu tutarl\u0131 bir g\u00fc\u00e7l\u00fc \u0131\u015f\u0131k kayna\u011f\u0131, bir He-Ne gaz lazeri (\u03bb = 0.63) Par\u00e7ac\u0131k da\u011f\u0131t\u0131c\u0131s\u0131 (\u0131slak ve kuru) Dedekt\u00f6r\u00fcn sa\u00e7\u0131lma spektrumunu \u00f6l\u00e7\u00fcn (\u00e7ok say\u0131da fotodiyot) Bilgisayar (ekipman\u0131 kontrol etmek ve par\u00e7ac\u0131k boyutu da\u011f\u0131l\u0131m\u0131n\u0131 hesaplamak i\u00e7in) Teknolojik geli\u015fmeler sayesinde, alt \u00f6l\u00e7\u00fcm s\u0131n\u0131r\u0131 0.1um olabilir, baz\u0131 Kar\u0131\u015f\u0131m, test \u00e7al\u0131\u015fma ad\u0131mlar\u01311, s\u0131v\u0131y\u0131 (gaz) 2 kurmak ve da\u011f\u0131tmak i\u00e7in ekipman haz\u0131rlanmas\u0131, numune incelemesi, haz\u0131rlanmas\u0131, dispersiyonu ve numune konsantrasyonu partik\u00fcl b\u00fcy\u00fckl\u00fc\u011f\u00fc aral\u0131\u011f\u0131n\u0131 ve partik\u00fcl \u015feklini ve tam dispersiyonun olup olmad\u0131\u011f\u0131n\u0131 kontrol eder; 3, \u00f6l\u00e7\u00fcm ( uygun optik modeli se\u00e7in) 4, \u00f6l\u00e7\u00fcm hatas\u0131 (sapma) te\u015fhis sisteminden gelen hata, yanl\u0131\u015f numune haz\u0131rlama, teorik varsay\u0131mdan sapma gelebilir par\u00e7ac\u0131klar\u0131n ns ve \/ veya neden oldu\u011fu cihaz\u0131n yanl\u0131\u015f \u00e7al\u0131\u015fmas\u0131 ve \u00e7al\u0131\u015fmas\u0131 nedeniyle; Yedi, yayg\u0131n olarak kullan\u0131lan lazer par\u00e7ac\u0131k boyutu \u00f6l\u00e7er \u00fcreticileriBritish Malvern lazer par\u00e7ac\u0131k boyutu analiz\u00f6r\u00fc (yurt d\u0131\u015f\u0131nda) Avrupa ve Amerika Birle\u015fik Devletleri gram lazer par\u00e7ac\u0131k boyutu analiz\u00f6r\u00fc (Zhuhai) Dandong lazer partik\u00fcl boyutu analiz\u00f6r\u00fc (Liaoning) Sekiz, test nesnesi1. Metalik olmayan her t\u00fcrl\u00fc toz: tungsten, hafif kalsiyum, talk, kaolin, grafit, wollastonit, brusit, barit, mika tozu, bentonit, diatomlu toprak, kil vb. Her t\u00fcrl\u00fc metal tozu: al\u00fcminyum tozu, \u00e7inko tozu, molibden tozu, tungsten tozu, magnezyum tozu, bak\u0131r tozu ve nadir toprak metal tozu, ala\u015f\u0131m tozu gibi. Di\u011fer toz: kataliz\u00f6r, \u00e7imento, a\u015f\u0131nd\u0131r\u0131c\u0131, ila\u00e7, b\u00f6cek ilac\u0131, g\u0131da, boya, boyalar, fosfor, nehir tortusu, seramik hammaddeleri, \u00e7e\u015fitli em\u00fclsiyonlar.
\nKaynak: Meeyou Carbide<\/p>\n

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First, the basic concept of particle size analysis(1) particles: with a certain size and shape of small objects, is the basic unit of the composition of the powder. It is very small, but microscopic but contains a lot of molecules and atoms;(2) particle size: the size of particles;(3) particle size distribution: a certain way to…<\/p>","protected":false},"author":1,"featured_media":1603,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_jetpack_memberships_contains_paid_content":false,"footnotes":""},"categories":[79,1],"tags":[],"jetpack_featured_media_url":"","jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/posts\/18530"}],"collection":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/comments?post=18530"}],"version-history":[{"count":0,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/posts\/18530\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/posts\/1603"}],"wp:attachment":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/media?parent=18530"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/categories?post=18530"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/tags?post=18530"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}